发明名称 METHOD AND DEVICE FOR ION SCATTERING SPECTROSCOPY MEASUREMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide an ion scattering spectroscopy measuring method which can appropriately determine irradiation quantity of probe particles. <P>SOLUTION: The ion scattering spectroscopy measuring method comprises: a step for starting radiation of probe particles to a sample; a step for integrating the number of the probe particles scattered at the sample and detected to a first irradiation quantity and obtaining a first ion scattering spectrum; a step for integrating the number of the detected probe particles to a second irradiation quantity which is more than the first irradiation quantity and obtaining a second ion scattering spectrum; a step for calculating a first scattering ratio which is the number of the detected probe particles per unit irradiation quantity for a first energy range corresponding to a first element in the sample, based on the first ion scattering spectrum; a step for calculating a second scattering ratio for the first energy range based on the second ion scattering spectrum; and a step for determining whether the difference of the second scattering ratio from the first scattering ratio is small or not relative to the standard. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012013502(A) 申请公布日期 2012.01.19
申请号 JP20100149355 申请日期 2010.06.30
申请人 FUJITSU LTD 发明人 ITANI TSUKASA
分类号 G01N23/203 主分类号 G01N23/203
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