| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a thermal shock testing device ensuring high testing accuracy while saving energy, as well as ensuring time efficiency of a test. <P>SOLUTION: A thermal shock testing device 1 has a high temperature tank 2 and a low temperature tank 3, and is able to alternatively perform heating test control in which a sample body is exposed under a high temperature atmosphere and cooling test control in which the sample body is exposed under a low temperature atmosphere. While the testing control is performed using one of the tanks, changeover preparation control is performed in the other tank. In the changeover preparation control, heating up or cooling down of the atmosphere is performed after a fixed period of rest time has elapsed from the test control. The rest time is determined by a rest time determination function based on information collected by a temperature information collection function, the information regarding temperature changes in the respective tanks. The information regarding the temperature changes is updated automatically, thereby realizing a control which reflects actual conditions. <P>COPYRIGHT: (C)2012,JPO&INPIT |
