MEASUREMENT CIRCUIT, AND TESTING DEVICE

摘要

Disclosed is a measurement circuit for measuring an inputted signal to be measured. Specifically disclosed is a measurement circuit provided with: a level comparison unit for outputting a logical value in accordance with the results of comparing the signal level of a signal to be measured with a preset threshold level; a logic comparison unit for acquiring the logical value outputted by the level comparison unit at an inputted comparison timing; and a timing adjustment unit for adjusting, on the basis of the expected value pattern of the signal to be measured and the threshold level, the relative phase of the comparison timing and the signal outputted by the level comparison unit, and for inputting the aforementioned relative phase to the logic comparison unit.