发明名称 FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM
摘要 <p>An optical inspection system includes a fluorescence channel that detects fluorescent behavior (or lack thereof) of artifacts present on a surface under inspection and at least one other optical channel for determining a characteristic of the surface under inspection in an illuminated spot. The other optical channel may be a height measuring channel, such as an interferometric channel or a deflectometric channel, the other optical channel may be a scatterometric channel, or both height measurement and scatterometry may be employed in combination as a three channel system. The presence of absence of fluorescent behavior may be used to correct assumptions about or determine a type of artifact detected by scatterometry, and may be used to correct the polarity of a height measurement made by a height-measuring channel.</p>
申请公布号 WO2012009240(A1) 申请公布日期 2012.01.19
申请号 WO2011US43482 申请日期 2011.07.09
申请人 XYRATEX TECHNOLOGY LIMITED 发明人 BRUNFELD, ANDREI;TOKER, GREGORY;CLARK, BRYAN
分类号 G01N21/47 主分类号 G01N21/47
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