发明名称 |
Method And System For Impedance Measurement In An Integrated Circuit |
摘要 |
A method for determining a power supply impedance profile (|Z(f)|) at a predetermined load location within an electronic system. A repetitive activity (such as a modulated clock tree signal) is applied in the load location, and the local power supply voltage (U(t)) caused by this repetitive activity is measured. Rather than measuring the corresponding current consumption (I(t)) caused by the repetitive activity, the current consumption is calculated analytically. The local power supply impedance profile (|Z(f)|) is calculated as the ratio of the frequency-domain voltage and current consumption magnitudes (|U(f)|, |I(f)|) of the measured power supply voltage (U(t)) and the calculated current consumption (I(t)). |
申请公布号 |
US2012013353(A1) |
申请公布日期 |
2012.01.19 |
申请号 |
US201113087602 |
申请日期 |
2011.04.15 |
申请人 |
FRECH ROLAND;SUPPER JOCHEN;WINKEL THOMAS-MICHAEL;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FRECH ROLAND;SUPPER JOCHEN;WINKEL THOMAS-MICHAEL |
分类号 |
G01R27/28 |
主分类号 |
G01R27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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