发明名称 SYSTEM AND METHOD FOR CAPTURING ILLUMINATION REFLECTED IN MULTIPLE DIRECTIONS
摘要 <p>PURPOSE: A system and a method for capturing illumination reflected into multiple directions are provided to automatically detect defect and failure by performing the digital analysis for a reference image and an operation image. CONSTITUTION: A system includes a first image capturing device(32) and a second image capturing device(34). The first image capturing device and the second image capturing device receive darkfield illumination which is provided with a darkfield illumination device(28) having a low angle and the darkfield illumination device(30) having a high angle. The first image capturing device and the second image capturing device capture a monochromatic image and a color image. An optic inspection head(14) includes a first tube lens and a second tube lens.</p>
申请公布号 KR20120006952(A) 申请公布日期 2012.01.19
申请号 KR20110069618 申请日期 2011.07.13
申请人 SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD. 发明人 AMANULLAH AJHARALI
分类号 H01L21/66;G01N21/956 主分类号 H01L21/66
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