发明名称 |
SYSTEM AND METHOD FOR CAPTURING ILLUMINATION REFLECTED IN MULTIPLE DIRECTIONS |
摘要 |
<p>PURPOSE: A system and a method for capturing illumination reflected into multiple directions are provided to automatically detect defect and failure by performing the digital analysis for a reference image and an operation image. CONSTITUTION: A system includes a first image capturing device(32) and a second image capturing device(34). The first image capturing device and the second image capturing device receive darkfield illumination which is provided with a darkfield illumination device(28) having a low angle and the darkfield illumination device(30) having a high angle. The first image capturing device and the second image capturing device capture a monochromatic image and a color image. An optic inspection head(14) includes a first tube lens and a second tube lens.</p> |
申请公布号 |
KR20120006952(A) |
申请公布日期 |
2012.01.19 |
申请号 |
KR20110069618 |
申请日期 |
2011.07.13 |
申请人 |
SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD. |
发明人 |
AMANULLAH AJHARALI |
分类号 |
H01L21/66;G01N21/956 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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