发明名称 PARTICLE FIXING STRUCTURE, PARTICLE ANALYZING DEVICE, AND ANALYZING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a technology capable of reducing back ground noise or cross talk noise, and carrying out the optical observation of a large number of fine particles with high sensitivity and high accuracy. <P>SOLUTION: A particle fixing structure 14 has a plurality of holding holes 9 respectively holding inspected particles for detecting light emitted from substances indicating the existence of ingredients constituting the inspected particles; and comprises a platy translucent base plate 15, a holding portion 20 disposed on a first surface of the base plate 15 and formed with a plurality of the holding holes 9, and a light shielding film 19 disposed on a second surface of the base plate 15. The holding holes 9 open on an upper surface of the holding portion 20, and extend to the first surface of the base plate 15. The light shielding film 19 has a plurality of opening portions 9 exposing the second surface of the base plate 15 at positions corresponding to the plurality of the holding holes 9. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012013550(A) 申请公布日期 2012.01.19
申请号 JP20100150521 申请日期 2010.06.30
申请人 TOSOH CORP 发明人 MOGAMI AKIFUMI;MORIMOTO ATSUSHI;FUTAMI TATSU
分类号 G01N21/03;C12M1/34;C12Q1/02;G01N1/00;G01N21/64;G01N33/483;G01N35/02 主分类号 G01N21/03
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