发明名称 |
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION |
摘要 |
Provided is an actinic ray-sensitive or radiation-sensitive resin composition including: (A) a resin capable of increasing the solubility in an alkali developer by the action of an acid, the resin containing (a) a repeating unit represented by the following formula (AN-01), (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation, and (C) a resin that contains at least either a fluorine atom or a silicon atom and contains a repeating unit having a group capable of decomposing by the action of an alkali developer to increase the solubility in an alkali developer: wherein the variables in formula (AN-01) are defined in the description. |
申请公布号 |
US2012015301(A1) |
申请公布日期 |
2012.01.19 |
申请号 |
US201013258898 |
申请日期 |
2010.03.31 |
申请人 |
YOSHIDOME MASAHIRO;HIRANO SHUJI;SAEGUSA HIROSHI;IWATO KAORU;IIZUKA YUSUKE;FUJIFILM CORPORATION |
发明人 |
YOSHIDOME MASAHIRO;HIRANO SHUJI;SAEGUSA HIROSHI;IWATO KAORU;IIZUKA YUSUKE |
分类号 |
G03F7/20;G03F7/004;G03F7/075 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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