发明名称 |
Fault diagnosis method, fault diagnosis apparatus, and computer-readable storage medium |
摘要 |
A fault diagnosis may perform a statistical analysis based on a fault report of a semiconductor device, in order to output a feature that becomes the cause of the fault depending on a contribution of the feature to the fault. A process of grouping circuit information of the semiconductor device into N groups using one kind of feature as an index may be performed for K kinds of features, in order to group the circuit information into K×N groups. A sum total of feature quantities of partial circuits belonging to each of the groups may be output in a form of a list of learning samples.
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申请公布号 |
US2012010829(A1) |
申请公布日期 |
2012.01.12 |
申请号 |
US201113067246 |
申请日期 |
2011.05.18 |
申请人 |
NITTA IZUMI;FUJITSU LIMITED |
发明人 |
NITTA IZUMI |
分类号 |
G06F19/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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