发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PURPOSE: A semiconductor integrated circuit device and a manufacturing method thereof are provided to miniaturize the occupied region of a device by forming the pitch of wave fluctuation, which is formed on the channel surface of an N channel MISFET(Metal Insulator Semiconductor Field Effect Transistor), to be narrow. CONSTITUTION: A semiconductor substrate includes a first and second major surface. A first N channel MISFET(Metal Insulator Semiconductor Field Effect Transistor)(Qnh) and a first P channel MISFET are formed the major surface of the semiconductor substrate. A first wave fluctuation(20n) is formed through the first source region and first drain region of the first N channel MISFET. A second wave fluctuation(20p) is formed through the second source region and second drain region of the first P channel MISFET. Ripple bottoms portions(30n, 30p) and reply portions are formed on the surface of channel regions(10n, 10p). |
申请公布号 |
KR20120004337(A) |
申请公布日期 |
2012.01.12 |
申请号 |
KR20110066382 |
申请日期 |
2011.07.05 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
YOSHIMORI HIROMASA;IWAMATSU TOSHIAKI |
分类号 |
H01L27/092;H01L21/336;H01L21/8238;H01L29/78 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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