发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE: A semiconductor integrated circuit device and a manufacturing method thereof are provided to miniaturize the occupied region of a device by forming the pitch of wave fluctuation, which is formed on the channel surface of an N channel MISFET(Metal Insulator Semiconductor Field Effect Transistor), to be narrow. CONSTITUTION: A semiconductor substrate includes a first and second major surface. A first N channel MISFET(Metal Insulator Semiconductor Field Effect Transistor)(Qnh) and a first P channel MISFET are formed the major surface of the semiconductor substrate. A first wave fluctuation(20n) is formed through the first source region and first drain region of the first N channel MISFET. A second wave fluctuation(20p) is formed through the second source region and second drain region of the first P channel MISFET. Ripple bottoms portions(30n, 30p) and reply portions are formed on the surface of channel regions(10n, 10p).
申请公布号 KR20120004337(A) 申请公布日期 2012.01.12
申请号 KR20110066382 申请日期 2011.07.05
申请人 RENESAS ELECTRONICS CORPORATION 发明人 YOSHIMORI HIROMASA;IWAMATSU TOSHIAKI
分类号 H01L27/092;H01L21/336;H01L21/8238;H01L29/78 主分类号 H01L27/092
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