| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce data read errors in a semiconductor integrated circuit that stores data using a fuse. <P>SOLUTION: A semiconductor integrated circuit 100 comprises: a fuse circuit 10 including multiple fuses connected in series; a disconnection current supplying unit 30 for supplying a disconnection current to the multiple fuses; and a reading unit 20 for reading disconnection information on the multiple fuses. The fuse circuit 10 includes a first terminal N1 and a second terminal N2. The multiple fuses includes a first fuse F1 connected to the first terminal N1 and a second fuse F2 connected to the second terminal N2. The reading unit 20, including an output circuit 40 for outputting the disconnection information, is connected to a first power source terminal Vdd connected to the first terminal N1, a second power source terminal Vss connected to the second terminal N2, and between the first terminal N1 and the first power source terminal Vdd (N3). <P>COPYRIGHT: (C)2012,JPO&INPIT |
