发明名称 PARTICULATE FOREIGN MATERIAL INSPECTING DEVICE USING PARTICULATE SIEVING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a particulate foreign material inspecting device using a particulate sieving device capable of sieving particulates with a simple structure. <P>SOLUTION: A particulate foreign material inspecting device using a particulate sieving device comprises; a particulate supply mechanism 13 for supplying stored particulates; a sieving device body 15a for sieving with a sieving net 15h after the particulates supplied by the particulate supply mechanism 13 are charged; an elastic supporting member 15v for elastically supporting the sieving device body 15a on a fixed part; and a vibration generating source 15w for transmitting a vibration with being attached to the sieving device body. The particulates sieved by the sieving device are equalized while being conveyed by a powder conveying mechanism and foreign materials mixed in the powder supplied by the powder conveying mechanism are inspected by a foreign material inspecting mechanism. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012007999(A) 申请公布日期 2012.01.12
申请号 JP20100144086 申请日期 2010.06.24
申请人 FUJI ELECTRIC CO LTD 发明人 AKATSUKA MITSUO;INOUE AKINORI;HIKICHI HARUO
分类号 G01N21/85;B65G69/12 主分类号 G01N21/85
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