发明名称 |
AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an automatic analyzer capable of improving S/N ratio characteristics of a light reception signal by reducing an influence of a scattered light of a noise component other than an object to be measured. <P>SOLUTION: A plurality of detectors 204 to 206 obtain data at a plurality of angles. A detected data selection part 18a selects a signal obtained by one of the detectors as a reference signal. An approximate expression selection part 18b1 in a first selection data processing part 18b selects an approximate expression to be applied, and an approximate expression calculation part 18b2 calculates the approximate expression by using the selected approximate expression. A variation coefficient calculation part 18b3 determines a coefficient of variation of the reference signal. A signal from the detector 205 is held by a second selection data processing part 18c and is corrected by dividing by the coefficient of variation of reference signal in a data correction part 18d. A concentration operation processing part 18e performs a concentration operation by using the corrected signal data, and a result output part 18f outputs a result to a CRT or the like. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012007921(A) |
申请公布日期 |
2012.01.12 |
申请号 |
JP20100142259 |
申请日期 |
2010.06.23 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
TAMURA TAKUO;SHIBA MASAKI;ADACHI SAKUICHIRO |
分类号 |
G01N21/49;G01N21/27;G01N35/00 |
主分类号 |
G01N21/49 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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