发明名称 HEAT PROCESSING APPARATUS AND HEAT PROCESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To suppress variations in heat processing temperatures in substrate surfaces and uniformize line widths of wiring patterns in the substrate surface. <P>SOLUTION: The heat processing apparatus comprises: a substrate transportation means 20; a first chamber 8A that covers predetermined sections of a substrate transportation passage 2 and forms a heat processing space for a processed substrate G to which the substrate transportation passage is transported; first means 17, 18 that can heat the inside of the first chamber; second means 41, 42 that can spray an air cooled to a predetermined temperature for the processed substrate to which the substrate transportation passage is transported and can locally cool the processed substrate; substrate detection means 45 for detecting the processed substrate which is provided in a front stage of the first chamber and to which the substrate transportation passage is transported; and control means 40 to which a detection signal of the substrate detection means is supplied and which turns on/off cooling operation performed by the second means. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012009527(A) 申请公布日期 2012.01.12
申请号 JP20100142366 申请日期 2010.06.23
申请人 TOKYO ELECTRON LTD 发明人 KAWAGUCHI YOSHIHIRO
分类号 H01L21/027;B65G49/06;H01L21/677 主分类号 H01L21/027
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