发明名称 Method Of Calibrating A Lithographic Apparatus, Device Manufacturing Method and Associated Data Processing Apparatus and Computer Program Product
摘要 A lithographic apparatus is calibrated by reference to a primary reference substrate. Using an apparatus which need not be the same as the one being calibrated, there is obtained an apparatus-specific fingerprint of the primary reference substrate. Using the same set-up there is then obtained an apparatus-specific fingerprint of a secondary reference substrate. The apparatus-specific fingerprint of the primary reference substrate is subtracted from the apparatus-specific fingerprint of the secondary reference substrate to obtain and store an apparatus-independent fingerprint of the secondary reference substrate. The secondary reference substrate and stored apparatus-independent fingerprint are subsequently used together in place of the primary reference substrate as a reference for the calibration of the lithographic apparatus to be calibrated. Initial set-up for a cluster of lithographic tools can be performed with less use of the costly primary reference substrate, and with less interruption to normal production. The initial set-up can be integrated with on-going monitoring and re-calibration of the apparatuses.
申请公布号 US2012008127(A1) 申请公布日期 2012.01.12
申请号 US201113169673 申请日期 2011.06.27
申请人 TEL WIM TJIBBO;PRIL WOUTER ONNO;THEEUWES THOMAS;PADIY ALEXANDER VIKTOROVYCH;ASML NETHERLANDS B.V. 发明人 TEL WIM TJIBBO;PRIL WOUTER ONNO;THEEUWES THOMAS;PADIY ALEXANDER VIKTOROVYCH
分类号 G03B27/32;G06K9/00 主分类号 G03B27/32
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