发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes a thin film transistor. The thin film transistor includes a semiconductor film over a substrate, in which the semiconductor film includes a pair of first regions, a pair of second regions interposed between the pair of first regions, and a channel formation region interposed between the pair of second regions. A concentration of an impurity in the pair of second regions is smaller than a concentration of the impurity in the pair of first regions. The thin film transistor includes an insulating film, in which a portion of the insulating film is provided over the semiconductor film. The thin film transistor includes a conductive film over the portion, and the conductive film includes a taper shape.
申请公布号 US2012007094(A1) 申请公布日期 2012.01.12
申请号 US201113226803 申请日期 2011.09.07
申请人 HAMADA TAKASHI;ARAI YASUYUKI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 HAMADA TAKASHI;ARAI YASUYUKI
分类号 H01L29/786;H01L33/08;G02F1/1362;H01L21/77;H01L21/84;H01L27/12;H01L29/423 主分类号 H01L29/786
代理机构 代理人
主权项
地址