| 摘要 |
<p>A multi-focus x-ray source (MFXS) for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MFXS (12) includes a plurality of focus points (54) defined along a length of the MFXS collinear with the y-axis (58). The MFXS (12) is configured to generate the plurality of primary beams (60), and at least M coherent x-ray scatter detectors (24) are configured to detect coherent scatter rays from the primary beams as the primary beams propagate through a section of the object positioned within the examination area (14) when a spacing P between adjacent coherent x-ray scatter detectors satisfies the equation: P=Ws⋅VM⋅U,
where Ws is a lateral extent of the plurality of focus points (54), U is a distance from the y-axis (58) to a top surface of the examination area, and V is a distance from the top surface to the line at the coordinate X = L.
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