发明名称 System and method for removing organic residue from a charged particle beam system
摘要 A system and method for removing an organic residue from a charged particle beam system includes a conduit that is coupled to the column and is for adding oxygen to the column. A heater is coupled to the column and is for increasing the temperature in the column. A pump is coupled to the column and is for removing a gas from the chamber, wherein the gas is a byproduct of a chemical reaction of the organic residue and the oxygen.
申请公布号 US8092641(B1) 申请公布日期 2012.01.10
申请号 US20050199898 申请日期 2005.08.08
申请人 XIAO HONG;HERMES-MICROVISION, INC. 发明人 XIAO HONG
分类号 B08B7/00 主分类号 B08B7/00
代理机构 代理人
主权项
地址