发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A semiconductor device is provided to prevent hydrogen which is expanded to an oxide semiconductor layer by forming an insulating layer having halogen concentration more than 1×1020atoms/cm^3 and hydrogen concentration less than 6×1020atoms/cm^3. CONSTITUTION: An oxide semiconductor layer(106) is formed on an insulating layer(108). One part of a gate insulating layer(104) is touched with the oxide semiconductor layer. A gate electrode layer(103) is formed on the gate insulating layer. The hydrogen concentration of the insulating layer is less than 6×1020atoms/cm^3. The halogen concentration of the insulating layer is more than 1×1020atoms/cm^3. The insulating layer is provided between a substrate and the oxide semiconductor layer. The insulating layer is an oxide insulating layer.</p>
申请公布号 KR20120002927(A) 申请公布日期 2012.01.09
申请号 KR20110064209 申请日期 2011.06.30
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ICHIJO MITSUHIRO;ENDO TOSHIYA;SUZUKI KUNIHIKO;TAKEMURA YASUHIKO
分类号 H01L29/786;G02F1/136;H01L21/336 主分类号 H01L29/786
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