发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A semiconductor device is provided to prevent hydrogen which is expanded to an oxide semiconductor layer by forming an insulating layer having halogen concentration more than 1×1020atoms/cm^3 and hydrogen concentration less than 6×1020atoms/cm^3. CONSTITUTION: An oxide semiconductor layer(106) is formed on an insulating layer(108). One part of a gate insulating layer(104) is touched with the oxide semiconductor layer. A gate electrode layer(103) is formed on the gate insulating layer. The hydrogen concentration of the insulating layer is less than 6×1020atoms/cm^3. The halogen concentration of the insulating layer is more than 1×1020atoms/cm^3. The insulating layer is provided between a substrate and the oxide semiconductor layer. The insulating layer is an oxide insulating layer.</p> |
申请公布号 |
KR20120002927(A) |
申请公布日期 |
2012.01.09 |
申请号 |
KR20110064209 |
申请日期 |
2011.06.30 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ICHIJO MITSUHIRO;ENDO TOSHIYA;SUZUKI KUNIHIKO;TAKEMURA YASUHIKO |
分类号 |
H01L29/786;G02F1/136;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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