发明名称 METHOD OF ETCHING SACRIFICIAL LAYER
摘要 An exemplary method of etching sacrificial layer includes steps of: providing a substrate formed with a sacrificial layer and defined with a first region and a second region, the sacrificial layer disposed in both the first and second regions; forming a hard mask covering the first region while exposing the second region; performing a first etching process on the sacrificial layer to thin the sacrificial layer while forming a byproduct film overlying the thinned sacrificial layer; performing a second etching process on the byproduct film to remove a portion of the byproduct layer for exposing a portion of the thinned sacrificial layer, while another portion of the byproduct film disposed on sidewalls of the thinned sacrificial layer being remained; and performing a third etching process on the thinned sacrificial layer, to remove the portion of the thinned sacrificial layer exposed in the second etching process.
申请公布号 US2012003835(A1) 申请公布日期 2012.01.05
申请号 US20100830370 申请日期 2010.07.05
申请人 YANG CHAN-LON;WANG YENG-PENG;YEH CHIU-HSIEN;UNITED MICROELECTRONICS CORP. 发明人 YANG CHAN-LON;WANG YENG-PENG;YEH CHIU-HSIEN
分类号 H01L21/308;H01L21/306 主分类号 H01L21/308
代理机构 代理人
主权项
地址