发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a trench structure with high withstand voltage, and a manufacturing method thereof. <P>SOLUTION: The semiconductor device includes a conductive layer 17 formed via an insulator film 16 in a trench 21 formed in a semiconductor substrate 11. An opening 18 of the trench 21 has a curved surface of a folding-fan shape extending from a side wall 21c of the trench 21 to a surface 11a of the semiconductor substrate 11 to which a plurality of dents 22 and 23 are connected. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012004156(A) 申请公布日期 2012.01.05
申请号 JP20100134938 申请日期 2010.06.14
申请人 TOSHIBA CORP 发明人 SAKAI TAKAYUKI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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