| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a high-intensity laser scanning microscope capable of spectrally detecting light with high wavelength resolution with a simple and inexpensive configuration. <P>SOLUTION: The laser scanning microscope 1 includes a light source 10 for emitting laser light, a XY galvano scanner 22 for scanning the emitted laser light, an objective lens 45 for radiating the scanned laser light to a sample A while collecting light from the sample A, a transmissive diffraction grating for dispersing the collected light from the sample A to plural wavelength bands, a light detection unit 36 for detecting the dispersed light, and a galvanometer for changing an incidence angle of the light from the sample A into the diffraction grating. The galvanometer changes the incidence angle of the light from the sample A into the diffraction grating by each detected wavelength band such that lights of plural wavelength bands detected by the light detection unit 36 respectively satisfy the Bragg's reflection condition. <P>COPYRIGHT: (C)2012,JPO&INPIT |
