发明名称 Semiconductor Device Manufacturing Apparatus Capable Of Reducing Particle Contamination
摘要 A plasma processing method of subjecting a substance to plasma processing by using a semiconductor device manufacturing apparatus including a process chamber, a unit for supplying gas to the process chamber, an exhausting unit to reduce pressure in the process chamber, a high frequency power source for plasma generation, a coil for generating a magnetic field, and a mounted electrode for mounting the substance to be processed. The method includes steps of subjecting the substance to a predetermined plasma processing, changing the magnetic field distribution, so as to make a plasma distribution of the process chamber with respect to the surface of the substance to be processed, in a convex form, at a time of igniting the plasma and after completion of the predetermined plasma processing, as compared with a plasma distribution with respect to the surface of the substance to be processed during the predetermined plasma processing.
申请公布号 US2012003837(A1) 申请公布日期 2012.01.05
申请号 US201113229843 申请日期 2011.09.12
申请人 KOBAYASHI HIROYUKI;MAEDA KENJI;YOKOGAWA KENETSU;IZAWA MASARU 发明人 KOBAYASHI HIROYUKI;MAEDA KENJI;YOKOGAWA KENETSU;IZAWA MASARU
分类号 H01L21/3065;H01L21/31 主分类号 H01L21/3065
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