发明名称 IMPEDANCE CALIBRATION CIRCUIT
摘要 Various embodiments of an impedance calibration circuit are disclosed. In one exemplary embodiment, the impedance calibration circuit may include a control unit configured to generate a plurality of first internal commands for defining an impedance calibration operation in response to an external signal, a temperature-adaptive control unit configured to generate a second internal command for defining an impedance calibration operation by detecting a temperature change, a timer counter configured to generate an operation control signal that prescribes a duration of time for an impedance calibration operation in response to the plurality of first internal commands and the second internal command, and an impedance calibration signal generation unit configured to operate for a predetermined time defined by the operation control signal and generate impedance calibration signals.
申请公布号 US2012002697(A1) 申请公布日期 2012.01.05
申请号 US20100970858 申请日期 2010.12.16
申请人 CHO JIN HEE;HYNIX SEMICONDUCTOR INC. 发明人 CHO JIN HEE
分类号 G01N25/00 主分类号 G01N25/00
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