发明名称 LOW DOSE SINGLE STEP GRATING BASED X-RAY PHASE CONTRAST IMAGING
摘要 Phase sensitive X-ray imaging methods provide substantially increased contrast over conventional absorption based imaging, and therefore new and otherwise inaccessible information. The use of gratings as optical elements in hard X-ray phase imaging overcomes some of the problems impairing the wider use of phase contrast in X-ray radiography and tomography. To separate the phase information from other contributions detected with a grating interferometer, a phase-stepping approach has been considered, which implies the acquisition of multiple radiographic projections. Here, an innovative, highly sensitive X-ray tomographic phase contrast imaging approach is presented based on grating interferometry, which extracts the phase contrast signal without the need of phase stepping. Compared to the existing phase step approach, the main advantage of this new method dubbed “reverse projection” is the significantly reduced delivered dose, without degradation of the image quality.
申请公布号 EP2400891(A1) 申请公布日期 2012.01.04
申请号 EP20100703260 申请日期 2010.02.03
申请人 INSTITUTE OF HIGH ENERGY PHYSICS;PAUL SCHERRER INSTITUT 发明人 ZHU, PEIPING;WU, ZIYU;STAMPANONI, MARCO
分类号 A61B6/00;G01N23/04 主分类号 A61B6/00
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