发明名称 Integrated circuit using FinFETs and having a static random access memory (SRAM)
摘要 An integrated circuit includes a logic circuit and a memory cell. The logic circuit includes a P-channel transistor, and the memory cell includes a P-channel transistor. The P-channel transistor of the logic circuit includes a channel region. The channel region has a portion located along a sidewall of a semiconductor structure having a surface orientation of (110). The portion of the channel region located along the sidewall has a first vertical dimension that is greater than a vertical dimension of any portion of the channel region of the P-channel transistor of the memory cell located along a sidewall of a semiconductor structure having a surface orientation of (110).
申请公布号 US8088657(B2) 申请公布日期 2012.01.03
申请号 US20100785829 申请日期 2010.05.24
申请人 BURNETT JAMES D.;MATHEW LEO;MIN BYOUNG W.;FREESCALE SEMICONDUCTOR, INC. 发明人 BURNETT JAMES D.;MATHEW LEO;MIN BYOUNG W.
分类号 H01L21/8244;H01L29/78 主分类号 H01L21/8244
代理机构 代理人
主权项
地址