| 摘要 |
A test apparatus includes a transmitting-side jitter measuring unit which measures a jitter of a transmission signal output from a transmitting circuit, a jitter applying unit which applies a jitter to the transmission signal and inputs the signal to a receiving circuit, a jitter range measuring unit which determines whether the logical value of the transmission signal detected by the receiving circuit is equal to a preset expectation value for each amplitude of the jitter applied to the transmission signal by the jitter applying unit, and measures the range of jitter amplitudes within which the logical value of the transmission signal is equal to the expectation value, and a jitter tolerance measuring unit which calculates jitter tolerance of the receiving circuit based on the jitter of the transmission signal measured by the transmitting-side jitter measuring unit and the range of jitter amplitudes measured by the jitter range measuring unit. |
