发明名称 Data read-out circuit in semiconductor memory device and method of data reading in semiconductor memory device
摘要 A data read-out circuit is provided with a sense amplifier circuit and a selector. The sense amplifier circuit senses a stored data stored in a memory cell array by using a plurality of reference levels to generate a plurality of read data, respectively. Thus, the sense amplifier circuit outputs the plurality of read data with regard to the stored data. The selector selects a data corresponding to any one of the plurality of read data based on a control signal and outputs the selected data as an output data.
申请公布号 US8091008(B2) 申请公布日期 2012.01.03
申请号 US20070834426 申请日期 2007.08.06
申请人 OKU SATORU;RENESAS ELECTRONICS CORPORATION 发明人 OKU SATORU
分类号 G11C29/00 主分类号 G11C29/00
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