发明名称 |
NONVOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: A nonvolatile memory device is provided to prevent malfunctions due to a leakage current due to a precharge voltage by preventing the supply of a precharge voltage in a test operation. CONSTITUTION: In a nonvolatile memory device, a cell array(100) comprises a plurality of unit cells. A bit line sense amplifier(200) senses data which is stored in a plurality of unit cells. A bit line sense amplifier comprises a precharging unit and a test controller. The precharging unit precharges according to a precharge signal. A test signal is inputted, and a test controller stops the precharging operation when the test signal is inputted. The test controller performs a test operation.
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申请公布号 |
KR20120000330(A) |
申请公布日期 |
2012.01.02 |
申请号 |
KR20100060644 |
申请日期 |
2010.06.25 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
TAK, JUNG MI;YOON, HYUCK SOO |
分类号 |
G11C13/02;G11C5/14;G11C7/06;G11C29/10 |
主分类号 |
G11C13/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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