发明名称 NONVOLATILE MEMORY DEVICE
摘要 PURPOSE: A nonvolatile memory device is provided to prevent malfunctions due to a leakage current due to a precharge voltage by preventing the supply of a precharge voltage in a test operation. CONSTITUTION: In a nonvolatile memory device, a cell array(100) comprises a plurality of unit cells. A bit line sense amplifier(200) senses data which is stored in a plurality of unit cells. A bit line sense amplifier comprises a precharging unit and a test controller. The precharging unit precharges according to a precharge signal. A test signal is inputted, and a test controller stops the precharging operation when the test signal is inputted. The test controller performs a test operation.
申请公布号 KR20120000330(A) 申请公布日期 2012.01.02
申请号 KR20100060644 申请日期 2010.06.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 TAK, JUNG MI;YOON, HYUCK SOO
分类号 G11C13/02;G11C5/14;G11C7/06;G11C29/10 主分类号 G11C13/02
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