| 摘要 |
PURPOSE: An RFID apparatus is provided to facilitate the test of the performance of an RFID tag chip since measurement signals are directly applied through a test pad in a wafer level. CONSTITUTION: A common test pad receives memory address or data from the outside. The test interface unit(300) receives the memory address through the common test pad in the deactivation of the chip enable signal and receives the data through the common test pad in the activation of the chip enable signal in order to test a memory(400). The test interface unit comprises a test address latch(310), an address decoder(320), a data selector(330), and a data driver(340). |
