发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A method for manufacturing a semiconductor device is provided to improve the reliability of a semiconductor device by eliminating an interference effect between word lines. CONSTITUTION: A plurality of gate patterns(130) is formed on a substrate(100). A gate pattern comprises a first conductive layer pattern(110), a blocking insulating layer(115), a second conductive layer pattern(120), and a capping insulating layer(125). A first insulation layer(140), which fills a space between the gate pattern, is formed. The first insulation layer is etched to a predetermined depth. A second insulation layer(150) is formed on the gate patterns and the first insulation layer. A low dielectric material(160) is formed between the gate patterns.</p> |
申请公布号 |
KR20120000339(A) |
申请公布日期 |
2012.01.02 |
申请号 |
KR20100060660 |
申请日期 |
2010.06.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, YONG LACK;CHO, CHANG HYUN;CHUNG, SEUNG PIL;JANG, HYUN SEOK;SONG, DU HEON;CHOI, JUNG DAL |
分类号 |
H01L21/8247;H01L21/336;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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