发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for manufacturing a semiconductor device is provided to improve the reliability of a semiconductor device by eliminating an interference effect between word lines. CONSTITUTION: A plurality of gate patterns(130) is formed on a substrate(100). A gate pattern comprises a first conductive layer pattern(110), a blocking insulating layer(115), a second conductive layer pattern(120), and a capping insulating layer(125). A first insulation layer(140), which fills a space between the gate pattern, is formed. The first insulation layer is etched to a predetermined depth. A second insulation layer(150) is formed on the gate patterns and the first insulation layer. A low dielectric material(160) is formed between the gate patterns.</p>
申请公布号 KR20120000339(A) 申请公布日期 2012.01.02
申请号 KR20100060660 申请日期 2010.06.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, YONG LACK;CHO, CHANG HYUN;CHUNG, SEUNG PIL;JANG, HYUN SEOK;SONG, DU HEON;CHOI, JUNG DAL
分类号 H01L21/8247;H01L21/336;H01L27/115 主分类号 H01L21/8247
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