发明名称 |
MOS DEVIDE STRUCTURE FOR PREVENTING FLOATING BODY EFFECT AND SELF-HEATING EFFECT AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>A MOS device structure for preventing floating body effect and self-heating effect and the manufacturing method thereof are provided. The MOS device structure comprises a Si substrate (1) and an active area including a channel area (31) and the source/drain areas (32, 33) located on both ends thereof on the Si substrate (1), a gate electrode (41) disposed on the channel (31), an buried insulation layer (51) disposed between the source/drain areas (32, 33) and the Si substrate (1) respectively, a SiGe isolation layer disposed between the channel (31) and the Si substrate (1). Such structure could prevent the device from floating body effect and self-heating effect, and reduce parasitic capacitance between the source and the drain.</p> |
申请公布号 |
WO2011160337(A1) |
申请公布日期 |
2011.12.29 |
申请号 |
WO2010CN76692 |
申请日期 |
2010.09.07 |
申请人 |
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATIONTECHNOLOGY, CHINESE ACADEMY OF SCIENCES;XIAO, DEYUAN;WANG, XI;HUANG, XIAOLU;CHEN, JING |
发明人 |
XIAO, DEYUAN;WANG, XI;HUANG, XIAOLU;CHEN, JING |
分类号 |
H01L29/78;H01L21/336;H01L21/8238;H01L29/06 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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