发明名称 MOS DEVIDE STRUCTURE FOR PREVENTING FLOATING BODY EFFECT AND SELF-HEATING EFFECT AND MANUFACTURING METHOD THEREOF
摘要 <p>A MOS device structure for preventing floating body effect and self-heating effect and the manufacturing method thereof are provided. The MOS device structure comprises a Si substrate (1) and an active area including a channel area (31) and the source/drain areas (32, 33) located on both ends thereof on the Si substrate (1), a gate electrode (41) disposed on the channel (31), an buried insulation layer (51) disposed between the source/drain areas (32, 33) and the Si substrate (1) respectively, a SiGe isolation layer disposed between the channel (31) and the Si substrate (1). Such structure could prevent the device from floating body effect and self-heating effect, and reduce parasitic capacitance between the source and the drain.</p>
申请公布号 WO2011160337(A1) 申请公布日期 2011.12.29
申请号 WO2010CN76692 申请日期 2010.09.07
申请人 SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATIONTECHNOLOGY, CHINESE ACADEMY OF SCIENCES;XIAO, DEYUAN;WANG, XI;HUANG, XIAOLU;CHEN, JING 发明人 XIAO, DEYUAN;WANG, XI;HUANG, XIAOLU;CHEN, JING
分类号 H01L29/78;H01L21/336;H01L21/8238;H01L29/06 主分类号 H01L29/78
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