发明名称 SUBSTRATE DRYING METHOD
摘要 According to one embodiment, a semiconductor substrate whose surface is wet with a chemical solution (solvent) and formed with patterns having an aspect ratio of 10 or more is loaded into a chamber. Then, while the chemical solution (solvent) remains on the semiconductor substrate, its temperature is increased to a predetermined temperature in the range of 160° C. or more and less than the critical temperature of the chemical solution (solvent), and the evaporated chemical solution (solvent) is discharged from the chamber.
申请公布号 US2011314689(A1) 申请公布日期 2011.12.29
申请号 US20100980079 申请日期 2010.12.28
申请人 OKUCHI HISASHI;SATO YOHEI;HAYASHI HIDEKAZU;TOMITA HIROSHI;KITAJIMA YUKIKO 发明人 OKUCHI HISASHI;SATO YOHEI;HAYASHI HIDEKAZU;TOMITA HIROSHI;KITAJIMA YUKIKO
分类号 F26B3/02;B08B3/00 主分类号 F26B3/02
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