发明名称 |
METHOD FOR MANUFACTURING CONTACT OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE WITH CONTACT |
摘要 |
<p>A method for manufacturing a contact of a semiconductor device and the semiconductor device with the contact are provided. The method comprises a contact structure is formed on source/drain regions (210), the bottom of the contact structure has a plurality of contact holes (222) with smaller hole diameters, and the top of the contact structure has trench contacts (228) with larger contact areas. The contact holes (222) with smaller hole diameters and the trench contacts (228) with larger contact areas are facilitated to connect with an upper metal layer, thereby conductive performance of the contact and overall performance of the device are improved.</p> |
申请公布号 |
WO2011160423(A1) |
申请公布日期 |
2011.12.29 |
申请号 |
WO2011CN00693 |
申请日期 |
2011.04.20 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHONG, HUICAI;LIANG, QINGQING |
发明人 |
ZHONG, HUICAI;LIANG, QINGQING |
分类号 |
H01L21/768;H01L21/336;H01L23/528;H01L29/78 |
主分类号 |
H01L21/768 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|