STRAIN GAGE RESISTANCE CALIBRATION USING SHUNTS

摘要

Strain gage resistance calibration using shunts. The strain gage includes an insulating, substrate. A resistive grid is formed on the substrate. A plurality of shunts are associated with the resistive grid, each of the shunts include one or more shunting bars. Severing a shunting bar alters (e.g., increases) the resistance of the resistive grid. Severing of the shunting bars can be performed by: chemical etching, electro-chemical etching, a laser beam, metal cutting and particle blasting. Shunting bars can be located on at least one edge of the resistive grid or in an internal area within the resistive grid. In a preferred embodiment, the insulating substrate is flexible.