发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS
摘要 <p>PURPOSE: A method of manufacturing a semiconductor device and a substrate processing apparatus are provided to form a good insulating film having uniform thickness with low costs by maintaining high rate of forming a thin film in low temperature. CONSTITUTION: In a method of manufacturing a semiconductor device and a substrate processing apparatus, a Substrate is loaded in a treatment basin. At least two kinds of gases are supplied to form a layer, including an element, in the substrate. At least two kinds of gas and other gas are supplied to the treatment basin to form a thin film in the substrate. The processed substrate is unloaded from the treatment basin.</p>
申请公布号 KR20110139179(A) 申请公布日期 2011.12.28
申请号 KR20110120253 申请日期 2011.11.17
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 AKAE NAONORI;HIROSE YOSHIRO;TAKASAWA YUSHIN;OTA YOSUKE;SASAJIMA RYOTA
分类号 H01L21/314;H01L21/205;H01L21/8247;H01L27/115 主分类号 H01L21/314
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