发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
<p>PURPOSE: A method of manufacturing a semiconductor device and a substrate processing apparatus are provided to form a good insulating film having uniform thickness with low costs by maintaining high rate of forming a thin film in low temperature. CONSTITUTION: In a method of manufacturing a semiconductor device and a substrate processing apparatus, a Substrate is loaded in a treatment basin. At least two kinds of gases are supplied to form a layer, including an element, in the substrate. At least two kinds of gas and other gas are supplied to the treatment basin to form a thin film in the substrate. The processed substrate is unloaded from the treatment basin.</p> |
申请公布号 |
KR20110139179(A) |
申请公布日期 |
2011.12.28 |
申请号 |
KR20110120253 |
申请日期 |
2011.11.17 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
AKAE NAONORI;HIROSE YOSHIRO;TAKASAWA YUSHIN;OTA YOSUKE;SASAJIMA RYOTA |
分类号 |
H01L21/314;H01L21/205;H01L21/8247;H01L27/115 |
主分类号 |
H01L21/314 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|