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发明名称
METHOD AND APPARATUS FOR INSPECTING MARKING OF SEMICONDUCTOR PACKAGE
摘要
申请公布号
EP1889288(A4)
申请公布日期
2011.12.28
申请号
EP20060768758
申请日期
2006.06.05
申请人
INTEKPLUS CO., LTD
发明人
KANG, MIN-GU;YOO, SEUNG-BONG;LEE, HYO-JOONG;LIM, SSANG-GUN
分类号
H01L21/66;G06K9/03
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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