发明名称 |
FABRICATING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A fabricating method of a semiconductor device is provided to prevent the contact resistance distribution between a phase change material and an electrode by improving the interface property of the electrode. CONSTITUTION: In a fabricating method of a semiconductor device, a first mold film(120) is formed on a semiconductor substrate(110). A first opening part(121) filling word lines(WL0,WL1) is formed in the first mold film. In said the first mold film, the first opening(121) crowding with the word line(WL0,WL1) is formed. A vertical cell diode(Dp) is formed on the word line. The vertical cell diode comprises a first semiconductor pattern(132) and a second semiconductor pattern(134). The first electrode(145) locates on the vertical cell diode. A phase change material pattern(211) is arranged in the first electrode.</p> |
申请公布号 |
KR20110138921(A) |
申请公布日期 |
2011.12.28 |
申请号 |
KR20100059099 |
申请日期 |
2010.06.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAE, BYOUNG JAE;CHOI, BYOUNG DEOG;PARK, JEONG HEE;KIM, YOUNG KUK;OH, JIN HO |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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