发明名称 FABRICATING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A fabricating method of a semiconductor device is provided to prevent the contact resistance distribution between a phase change material and an electrode by improving the interface property of the electrode. CONSTITUTION: In a fabricating method of a semiconductor device, a first mold film(120) is formed on a semiconductor substrate(110). A first opening part(121) filling word lines(WL0,WL1) is formed in the first mold film. In said the first mold film, the first opening(121) crowding with the word line(WL0,WL1) is formed. A vertical cell diode(Dp) is formed on the word line. The vertical cell diode comprises a first semiconductor pattern(132) and a second semiconductor pattern(134). The first electrode(145) locates on the vertical cell diode. A phase change material pattern(211) is arranged in the first electrode.</p>
申请公布号 KR20110138921(A) 申请公布日期 2011.12.28
申请号 KR20100059099 申请日期 2010.06.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, BYOUNG JAE;CHOI, BYOUNG DEOG;PARK, JEONG HEE;KIM, YOUNG KUK;OH, JIN HO
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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