发明名称 Method for forming minute pattern and method for forming semiconductor memory device using the same
摘要 A method for forming a minute pattern includes depositing a material layer on a semiconductor substrate having a conductive region, forming a first mask layer on the material layer, forming a recess region in the first mask layer, performing layer processing to form a first mask pattern in the recess region, and etching the material layer to form a material layer pattern.
申请公布号 US8083962(B2) 申请公布日期 2011.12.27
申请号 US20070783015 申请日期 2007.04.05
申请人 LEE JANG-EUN;NAM KYUNG-TAE;OH SE-CHUNG;JEONG JUN-HO;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JANG-EUN;NAM KYUNG-TAE;OH SE-CHUNG;JEONG JUN-HO
分类号 B44C1/22;C03C25/68;H01B13/00 主分类号 B44C1/22
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