发明名称 Semiconductor memory device having insulation patterns and cell gate patterns
摘要 Semiconductor memory devices and methods of forming semiconductor memory devices are provided. The methods may include forming insulation layers and cell gate layers that are alternately stacked on a substrate, forming an opening by successively patterning through the cell gate layers and the insulation layers, and forming selectively conductive barriers on sidewalls of the cell gate layers in the opening.
申请公布号 US8084819(B2) 申请公布日期 2011.12.27
申请号 US20090650137 申请日期 2009.12.30
申请人 KIM JINGYUN;LEE MYOUNGBUM;HWANG KIHYUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM JINGYUN;LEE MYOUNGBUM;HWANG KIHYUN
分类号 H01L27/01;H01L21/4763 主分类号 H01L27/01
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