发明名称 Abnormality detecting device for storage element, abnormality detecting method for storage element, abnormality detecting program for storage element, and computer-readable recording medium storing abnormality detecting program
摘要 An abnormality detecting device for a storage element is able to improve accuracy of abnormality detection for the storage element. The device includes at least an equalization process portion, an abnormality determination portion, a voltage measurement portion, and a control portion. The control portion issues a command to the equalization process portion to start an equalization process in a case where there is a variance in capacity of storage element blocks B1, B2, . . . and BN. The abnormality determination portion performs an abnormality determination on the storage element blocks B1, B2, . . . , and BN using voltages across the terminals of the respective storage element blocks B1, B2, . . . , and BN that have been allowed to stand after an elapse of a predetermined time since the end of the equalization process.
申请公布号 US8085051(B2) 申请公布日期 2011.12.27
申请号 US20070513321 申请日期 2007.11.01
申请人 IIDA TAKUMA;PANASONIC CORPORATION 发明人 IIDA TAKUMA
分类号 G01N27/416 主分类号 G01N27/416
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