发明名称 Method for testing noise of thin-film magnetic head, and magnetic disk drive apparatus with noise testing function
摘要 A noise-testing method for a thin-film magnetic head with an MR read head element and a heating unit capable of applying a heat and a stress to the MR read head element, includes a step of applying alternately and discontinuously with each other an electrical power having a first level and an electrical power having a second level higher than the first level to the heating unit, and a step of evaluating the thin-film magnetic head by measuring a noise output or noise outputs obtained from the MR read head element when the electrical power or the electrical powers are applied to the heating unit.
申请公布号 US8085038(B2) 申请公布日期 2011.12.27
申请号 US20070753836 申请日期 2007.05.25
申请人 UESUGI TAKUMI;KAGAMI TAKEO;SASAKI TETSURO;HIRATA KEI;HIROSE MASARU;LEE CHI MAN;TSO KWOK PIU;TDK CORPORATION;SAE MAGNECTICS (H.K.) LTD. 发明人 UESUGI TAKUMI;KAGAMI TAKEO;SASAKI TETSURO;HIRATA KEI;HIROSE MASARU;LEE CHI MAN;TSO KWOK PIU
分类号 G01R33/12;G11B5/00 主分类号 G01R33/12
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