发明名称 |
Method for testing noise of thin-film magnetic head, and magnetic disk drive apparatus with noise testing function |
摘要 |
A noise-testing method for a thin-film magnetic head with an MR read head element and a heating unit capable of applying a heat and a stress to the MR read head element, includes a step of applying alternately and discontinuously with each other an electrical power having a first level and an electrical power having a second level higher than the first level to the heating unit, and a step of evaluating the thin-film magnetic head by measuring a noise output or noise outputs obtained from the MR read head element when the electrical power or the electrical powers are applied to the heating unit. |
申请公布号 |
US8085038(B2) |
申请公布日期 |
2011.12.27 |
申请号 |
US20070753836 |
申请日期 |
2007.05.25 |
申请人 |
UESUGI TAKUMI;KAGAMI TAKEO;SASAKI TETSURO;HIRATA KEI;HIROSE MASARU;LEE CHI MAN;TSO KWOK PIU;TDK CORPORATION;SAE MAGNECTICS (H.K.) LTD. |
发明人 |
UESUGI TAKUMI;KAGAMI TAKEO;SASAKI TETSURO;HIRATA KEI;HIROSE MASARU;LEE CHI MAN;TSO KWOK PIU |
分类号 |
G01R33/12;G11B5/00 |
主分类号 |
G01R33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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