| 摘要 |
<P>PROBLEM TO BE SOLVED: To shorten the measuring time of a microwave irradiation testing device for analyzing effect exerted on a microwave electronic apparatus. <P>SOLUTION: Signal generating device control means (a measuring device 10A) creates a data base by measuring in advance the relation between a plurality of levels including the upper and lower limit values in the variable range of a level of a seed signal sc output from a signal generating device 21 and an electric field intensity based on an electric field intensity detection signal ed output from electric field detecting means (an optical electric field sensor 26), for each power amplifier 23<SB POS="POST">1</SB>, 23<SB POS="POST">2</SB>for each of arbitrary frequencies in a predetermined frequency band. The specified constant electric field intensity and the level of the seed signal sc corresponding to microwave w<SB POS="POST">1</SB>, w<SB POS="POST">2</SB>of the frequency are calculated based on the data base. A level control signal vc for generating the seed signal sc of the calculated level and a frequency control signal fc are applied to the signal generating device 21. <P>COPYRIGHT: (C)2012,JPO&INPIT |
