发明名称 PHOTOELECTRIC CONVERSION DEVICE AND MANUFACTURNING METHOD THEREOF
摘要 A photoelectric conversion device with a novel anti-reflection structure is provided. An uneven structure is formed on a surface of a semiconductor by growth of the same or different kind of semiconductor instead of forming an anti-reflection structure by etching a surface of a semiconductor substrate or a semiconductor film. For example, a semiconductor layer including a plurality of projections is provided for a light incident plane side of the photoelectric conversion device, thereby considerably reducing surface reflection. Such a structure can be formed by a vapor deposition method; therefore, the contamination of the semiconductor is not caused.
申请公布号 US2011308582(A1) 申请公布日期 2011.12.22
申请号 US201113159919 申请日期 2011.06.14
申请人 KATAISHI RIHO;NISHIDA JIRO;KURIKI KAZUTAKA;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KATAISHI RIHO;NISHIDA JIRO;KURIKI KAZUTAKA
分类号 H01L31/02;H01L31/18 主分类号 H01L31/02
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