发明名称 METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE AND APPARATUS FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 Disclosed is a method for manufacturing a SiC semiconductor device, which is provided with: a step (S4) of forming a first oxide film on the first surface of a SiC semiconductor; a step (S5) of removing the first oxide film; and a step (S6) of forming, on the second surface of the SiC semiconductor, a second oxide film that constitutes the SiC semiconductor device, said second surface being exposed by the removal of the first oxide film. Between the step (S4) of removing the first oxide film and the step (S6) of forming the second oxide film, the SiC semiconductor is disposed in an atmosphere isolated from the ambient atmosphere.
申请公布号 WO2011158533(A1) 申请公布日期 2011.12.22
申请号 WO2011JP54332 申请日期 2011.02.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;MASUDA, TAKEYOSHI;WADA, KEIJI;ITOH, SATOMI;HIYOSHI, TORU 发明人 MASUDA, TAKEYOSHI;WADA, KEIJI;ITOH, SATOMI;HIYOSHI, TORU
分类号 H01L21/316;H01L21/304;H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/316
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