发明名称 CONTACT PROBE
摘要 <P>PROBLEM TO BE SOLVED: To provide a contact probe which has low adhesion to an analyte (in particular, Sn included in an analyte) and can maintain stable contact resistance for a long period of time, and a connection device having the contact probe. <P>SOLUTION: A contact probe of the present invention is a contact probe that repeatedly contacts an electrode. A carbon coating containing a metal element is formed on the surface of the contact probe that contacts an electrode. The concentration of the metal element on the surface of the carbon coating is lower than the average concentration of the entire coating. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011257385(A) 申请公布日期 2011.12.22
申请号 JP20110104394 申请日期 2011.05.09
申请人 KOBE STEEL LTD;KOBELCO KAKEN:KK 发明人 HIRANO TAKAYUKI;KOHORI TAKASHI
分类号 G01R1/073 主分类号 G01R1/073
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