发明名称 |
FORMATION METHOD OF LAMINATED RESIN FILM AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a manufacturing method, etc. of a semiconductor device having a fine pattern with a high yield. <P>SOLUTION: A manufacturing method of a semiconductor device comprises: a step for forming a diffraction grating layer 7 and an insulating layer 9; a step for forming a silicon-free resin layer 11; a step for forming a periodic structure pattern 11p1; a step for forming a silicon-containing resin layer 13; a step for etching the silicon-containing resin layer 13; a step for etching the silicon-free resin layer 11 by using the silicon-containing resin layer 13 as a mask; and a step for etching the insulating layer 9 by using the silicon-free resin layer 11 as a mask. The step for forming the silicon-containing resin layer includes: a step for spin-coating a silicon-containing resin solution; a step for heating the silicon-containing resin layer 13 to a first temperature; and a step for spin-coating a rinsing solution 14 containing a volatile component on an outer edge 13e1 of the silicon-containing resin layer 13. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011258770(A) |
申请公布日期 |
2011.12.22 |
申请号 |
JP20100132261 |
申请日期 |
2010.06.09 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
TSUJI YUKIHIRO |
分类号 |
H01L21/027;H01L21/312;H01S5/12 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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