| 摘要 |
A method, apparatus and computer program are provided for automatically compensating a drift of a force applied by an Atomic Force Microscope during contact mode. The method makes it possible to automatically control and correct force drift in contact mode Atomic Force Microscopy. In a preferred embodiment, the present method includes steps measuring independently lateral and vertical vibration signals, analyzing theses signals and finally comparing theses signals to reference vibration signals. In a second embodiment, the vibration signals may be combined by means of an index, called force index.
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