发明名称 RESISTANCE-CHANGE MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a cell array structure that is capable of reducing the unit area per cell and preventing a decrease in yield in wiring processing. <P>SOLUTION: In a memory cell array 1 a memory cell pair comprises two memory cells in which word lines WL are arranged adjacently. The two memory cells share a bit line contact BLC. All memory cell pairs connected to two adjacent bit lines are connected to corresponding source lines SL via an individual source line contact SLC. The source lines SL are formed of a wiring layer upper than the bit lines BL at a larger pitch than that of bit lines BL. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011258829(A) 申请公布日期 2011.12.22
申请号 JP20100133295 申请日期 2010.06.10
申请人 SONY CORP 发明人 KITAGAWA MAKOTO;SHIIMOTO TSUNENORI;YOSHIHARA HIROSHI
分类号 H01L27/10;G11C13/00;H01L45/00;H01L49/00 主分类号 H01L27/10
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