发明名称 Graphene/Nanostructure FET with Self-Aligned Contact and Gate
摘要 A method for forming a field effect transistor (FET) includes depositing a channel material on a substrate, the channel material comprising one of graphene or a nanostructure; forming a gate over a first portion of the channel material; forming spacers adjacent to the gate; depositing a contact material over the channel material, gate, and spacers; depositing a dielectric material over the contact material; removing a portion of the dielectric material and a portion of the contact material to expose the top of the gate; recessing the contact material; removing the dielectric material; and patterning the contact material to form a self-aligned contact for the FET, the self-aligned contact being located over a source region and a drain region of the FET, the source region and the drain region comprising a second portion of the channel material.
申请公布号 US2011309334(A1) 申请公布日期 2011.12.22
申请号 US20100820341 申请日期 2010.06.22
申请人 CHANG JOSEPHINE;LAUER ISAAC;SLEIGHT JEFFREY;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHANG JOSEPHINE;LAUER ISAAC;SLEIGHT JEFFREY
分类号 H01L29/78;H01L21/84;H01L29/76 主分类号 H01L29/78
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